X-ray specular reflectivity measurements of a saturated film of helium absorbed onto an atomically flat silicon substrate have been made at several temperatures. The thickness of the film has been determined and some preliminary data on the structure of the 4He liquid-vapor interface are reported.
β¦ LIBER β¦
The Specular Reflection of X-rays.
β Scribed by BRAGG, W. L.
- Book ID
- 109456794
- Publisher
- Nature Publishing Group
- Year
- 1912
- Tongue
- English
- Weight
- 126 KB
- Volume
- 90
- Category
- Article
- ISSN
- 0028-0836
- DOI
- 10.1038/090410b0
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