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The self-formatting barrier characteristics of Cu–Mg/SiO2 and Cu–Ru/SiO2 films for Cu interconnects

✍ Scribed by Seol-Min Yi; Kwang-Ho Jang; Jung-Uk An; Sang-Soo Hwang; Young-Chang Joo


Book ID
108210753
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
523 KB
Volume
48
Category
Article
ISSN
0026-2714

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