Scanning Acoustic Force Microscope Inves
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Hesjedal, T.; Chilla, E.; Fr�hlich, H.-J.
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Article
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1997
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John Wiley and Sons
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English
⚖ 578 KB
We report on the investigation of surface acoustic wave (SAW) Ðelds by scanning acoustic force microscopy (SAFM), reaching submicron lateral resolution. The SAFM is based on a standard atomic force microscope and utilizes the non-linear force curve in the sense of a mechanical diode. The surface osc