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The role of metal and passivation defects in electromigration-induced damage in thin film conductors

✍ Scribed by J.R. Lloyd; P.M. Smith; G.S. Prokop

Publisher: Elsevier Science
Year: 1982
Tongue: English
Weight: 866 KB
Volume: 93
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(82)90144-4

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