✦ LIBER ✦

Grain boundary and vacancy diffusion model for electromigration-induced damage in thin film conductors

✍ Scribed by J.R. Lloyd; S. Nakahara

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The role of metal and passivation defect

✍ J.R. Lloyd; P.M. Smith; G.S. Prokop 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 866 KB

A statistical model for electromigration

📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 109 KB