✦ LIBER ✦
Kinetic study of electromigration failure in Cr/Al-Cu thin film conductors covered with polyimide and the problem of the stress dependent activation energy : J. R. Lloyd, M. Shatzkes and D. C. Challener. Proc. IEEE/IRPS, 216 (1988)
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 129 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0026-2714
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