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The role of interfacial segregation and microstructure in interdiffusion between aluminum and silicon

โœ Scribed by David C. Eng; Nicole Herbots; Olof C. Hellman; Olivier Vancauwenberghe; Shahrnaz Motakef; Robert J. Culbertson


Book ID
112816036
Publisher
Springer US
Year
1989
Tongue
English
Weight
654 KB
Volume
18
Category
Article
ISSN
0361-5235

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AbstractรEects of ยฎnal reduction and interfacial segregation of sulfur on surface-energy-induced selective grain growth have been investigated in 3% siliconยฑiron alloy strips with various bulk content of sulfur. Interfacial segregation kinetics of sulfur varies with annealing atmosphere: a convex pr