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The Role of Diffuse Scattering on Microdefects in the Precise Lattice Parameter Measurement

✍ Scribed by V. Holý; J. Härtwig

Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
601 KB
Volume
145
Category
Article
ISSN
0370-1972

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Precision lattice parameter measurements
Precision lattice parameter measurements of VPE-GaP-epitaxial layers by the „Umweganregung” method
✍ Dr. H.-G. Brühl 📂 Article 📅 1978 🏛 John Wiley and Sons 🌐 English ⚖ 268 KB 👁 1 views

## Precision Lattice Parameter Measurements of WE-Gap-Epitaxial Layers by the Wmweganregung" Method The "Umweganregung" technique according to a method described by SPOONER and WIL-SON was used for the accurate measurement of lattice parameters of (100) slice of VPEgrown layers of gallium phosphid