The role of Compton scattering in the low- Z elements X-ray fluorescence formation
β Scribed by Pavlinsky, G. V.; Portnoy, A. Yu.
- Book ID
- 121383919
- Publisher
- John Wiley and Sons
- Year
- 2013
- Tongue
- English
- Weight
- 404 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0049-8246
- DOI
- 10.1002/xrs.2525
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π SIMILAR VOLUMES
Microbeam x-ray fluorescence spectrometry was applied to the quantitative elemental mapping of elements and to the examination of the homogeneity of the elemental distribution in polymer samples. The measurements were performed with an energy-dispersive x-ray fluorescence microbeam spectrometer util
Inelastic X-ray scattering (IXS) is an important tool to study a large number of physical properties in condensed matter systems. We use this technique to study electronic excitations in Cr(110). The IXS spectra were measured at sector 12-ID-B (BESSRC) at the APS. We used a backscattering geometry f