Compton scattering of X-rays from solids in the one-electron model
β Scribed by P. D. Decicco
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 388 KB
- Volume
- 5
- Category
- Article
- ISSN
- 0020-7608
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Inelastic X-ray scattering (IXS) is an important tool to study a large number of physical properties in condensed matter systems. We use this technique to study electronic excitations in Cr(110). The IXS spectra were measured at sector 12-ID-B (BESSRC) at the APS. We used a backscattering geometry f
The Compton scattering of X-rays within a volume of a sample depends on the density of that voxel. The potential was examined of imaging the density variation across a food material by measuring the Compton scatter pro"le across polystyrene spheres with internal voids. Particular attention was paid