๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

The relationship of frequency of operation to large-signal noise degradation in IMPATT diodes

โœ Scribed by Sokolov, V.; Beyer, J.B.


Book ID
114591839
Publisher
IEEE
Year
1975
Tongue
English
Weight
466 KB
Volume
22
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES