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The Positron as a Probe for Studying Bulk and Defect Properties in Semiconductors

✍ Scribed by Doz. Dr. G. Dlubek; Prof. Dr. O. Brümmer

Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
603 KB
Volume
498
Category
Article
ISSN
0003-3804

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