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Pressure as a probe of deep levels and defects in semiconductors: Antisites and oxygen centers in GaAs

✍ Scribed by G.A. Samara; M. Skowronski; W.C. Mitchel


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
449 KB
Volume
56
Category
Article
ISSN
0022-3697

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