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The Phenomenology of Ion Implantation-Induced Blistering and Thin-Layer Splitting in Compound Semiconductors

✍ Scribed by R. Singh; S. H. Christiansen; O. Moutanabbir; U. Gösele


Book ID
107457015
Publisher
Springer US
Year
2010
Tongue
English
Weight
940 KB
Volume
39
Category
Article
ISSN
0361-5235

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