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The Phase-Shift Measurement of Thin Films and Its Amplification

✍ Scribed by ISHIGURO, KōZō


Book ID
115377324
Publisher
Optical Society of America
Year
1950
Weight
621 KB
Volume
40
Category
Article
ISSN
0030-3941

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The buckling method is presently one of the most commonly used methods in residual stress measurement, but still suffers from the problem that an array of structures occupying a large die area is required. In this paper, the buckling characteristics of annular thin plates were investigated and a new