New interferometric method for determining the refractive index of thin dielectric film, its thickness, the phase shift, and the order of interference

✍ Scribed by N. Barakat; F. F. A. El-Shazly; H. T. El-Shair

• Publisher: Springer
• Year: 1977
• Tongue: English
• Weight: 378 KB
• Volume: 14
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/bf00882738