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A method for measuring the complex refractive index and thickness of a thin metal film

✍ Scribed by K.H. Chen; C.C. Hsu; D.C. Su

Publisher: Springer
Year: 2003
Tongue: English
Weight: 149 KB
Volume: 77
Category: Article
ISSN: 0721-7269
DOI: 10.1007/s00340-003-1292-6

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