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Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry

✍ Scribed by Hui Xue, 薛晖; Weidong Shen, 沈伟东; Peifu Gu, 顾培夫; Zhenyue Luo, 罗震岳; Yueguang Zhang, 章岳光; Xu Liu, 刘旭

No coin nor oath required. For personal study only.

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