𝔖 Bobbio Scriptorium
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The oxidation of aluminum studied by sims at low energies

✍ Scribed by P.H. Dawson


Book ID
118981512
Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
560 KB
Volume
57
Category
Article
ISSN
0039-6028

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The use of ultra-low-energy dynamic SIMS
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This paper describes a new application in cultural heritage and other areas for a highly surface specific analytical technique originally developed for semiconductor research. The technique, ultra-low-energy dynamic secondary ion mass spectrometry (uleSIMS), is microdestructive, but has a sensitivit