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The morphological degradation mechanism of the TiSi2/Si structure

✍ Scribed by Y. S. Hwang; S. H. Paek; H. S. Kim; H. C. Cho; J. S. Choi; J. K. Jung; S. I. Lee; J. G. Lee

Publisher: Springer
Year: 1993
Tongue: English
Weight: 656 KB
Volume: 12
Category: Article
ISSN: 0261-8028
DOI: 10.1007/bf00418830

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