Surface roughness and resistivity of Au
β
Wu Tang; Kewei Xu; Ping Wang; Xian Li
π
Article
π
2003
π
Elsevier Science
π
English
β 188 KB
Au films were deposited on Si-(111) substrate by magnetron sputtering technique. The structure of the films was characterized by X-ray diffraction (XRD). The resistivity and the surface roughness were measured by four-point probe and atomic force microscopy (AFM). The results showed that Au-( ) was