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The Measurement of Conductivity and Permittivity of Semiconductor Spheres by an Extension of the Cavity Perturbation Method

โœ Scribed by Champlin, K.S. ;Krongard, R.R.


Book ID
114656390
Publisher
IEEE
Year
1961
Tongue
English
Weight
870 KB
Volume
9
Category
Article
ISSN
0018-9480

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