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Cavity Perturbation Techniques for Measurement of the Microwave Conductivity and Dielectric Constant of a Bulk Semiconductor Material

✍ Scribed by Eldumiati, I.I.; Haddad, G.I.

Book ID: 117926994
Publisher: IEEE
Year: 1972
Tongue: English
Weight: 608 KB
Volume: 20
Category: Article
ISSN: 0018-9480
DOI: 10.1109/tmtt.1972.1127695

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## Abstract The design of a cavity resonator implies to solve the Maxwell equations inside that cavity, respecting the boundary conditions. As a consequence, the resonance frequencies appear as conditions in the solutions of the differential equation involved. The measurement of the complex permitt