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Microwave Measurement of Conductivity and Permittivity of Semiconductor Spheres by Cavity Perturbation Technique

✍ Scribed by Mansingh, A.; Parkash, A.

Book ID: 114657612
Publisher: IEEE
Year: 1981
Tongue: English
Weight: 394 KB
Volume: 29
Category: Article
ISSN: 0018-9480
DOI: 10.1109/tmtt.1981.1130288

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