Effect of thickness and length of the sample on the dielectric constant ε′ and loss ε″ measurements in the microwave cavity perturbation technique

✍ Scribed by Murthy, V. R. K. ;Raman, R.

• Book ID: 105380817
• Publisher: John Wiley and Sons
• Year: 1988
• Tongue: English
• Weight: 150 KB
• Volume: 109
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211090158