✦ LIBER ✦

The low-frequency electrical noise as reliability estimation for high power semiconductor lasers

✍ Scribed by Hu Guijun; Shi Jiawei; Zhang Shumei; Li Yongjun

Book ID: 110396001
Publisher: Springer
Year: 2002
Tongue: English
Weight: 98 KB
Volume: 34
Category: Article
ISSN: 0306-8919
DOI: 10.1023/a:1020477502012

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