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An improved approach and experimental results of a low-frequency noise measurement technique used for reliability estimation of diode lasers

✍ Scribed by Shi Jiawei; Jin Ensun; Ma Jing; Dai Yisong; Zhang Xinfa


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
263 KB
Volume
34
Category
Article
ISSN
0026-2714

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