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The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS

✍ Scribed by John A. Kilner; Stephen J. Skinner; Hidde H. Brongersma

Publisher: Springer
Year: 2011
Tongue: English
Weight: 791 KB
Volume: 15
Category: Article
ISSN: 1432-8488
DOI: 10.1007/s10008-010-1289-0

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