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Surface and depth profiling techniques using XPS applied to the study of nickel-containing environmental particles

✍ Scribed by J.T. Rickman; R.W. Linton

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 876 KB
Volume: 68
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(93)90260-i

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