✦ LIBER ✦

The isochronal annealing study on the bias stressed amorphous silicon thin film transistors

✍ Scribed by Chi-Sun Hwang; Byung Seong Bae; Choochon Lee

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Analysis of bias stress on unpassivated

✍ Slade, H.C.; Shur, M.S. 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 201 KB

Annealing behavior of metastable defects

✍ Jeong Young Lee; Choonchon Lee; Jin Jang; Byung Seong Bae 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 250 KB

Degradation of Amorphous Silicon Thin Fi

✍ Dapeng Zhou; Mingxiang Wang; Shengdong Zhang 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 804 KB

Back-bias effect on the current-voltage

✍ Y. Kaneko; K. Tsutsui; T. Tsukada 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 335 KB

The photosensitivity of amorphous silico

✍ C. van Berkel; M.J. Powell 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 183 KB

Stability of amorphous-silicon thin-film

✍ Powell, M.J.; Nicholls, D.H. 📂 Article 📅 1983 🏛 The Institution of Electrical Engineers ⚖ 394 KB