The integrated reflection and halfwidth of silicon crystals with different dislocation densities have been measured on a double crystal spectrometer. A condition for detecting dislocations is that the effect of extinction be large compared to absorption. Using MoKcr, radiation, large differences in
The investigation of silicon web structural perfection
β Scribed by M. Ya. Dashevsky; V. A. Isaakyan; L. I. Savelyeva
- Publisher
- John Wiley and Sons
- Year
- 1975
- Tongue
- English
- Weight
- 86 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0232-1300
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β¦ Synopsis
Some works are dealing with the investigation of silicon web structure (O'HARA, SCHWUTTKE; YUNGBLUTH; TUCKER, SCHWUTTKE; BARRETT e t al. ) but the results are ambiguous. In this paper the structure of silicon webs was investigated both by X-ray and decorating methods.
The webs were grown between two supporting dendrites (their structure was described by-DASHEVSKY, ISAAKYAN, KHATSERNOV) in the [21 fl direction with Technik 5 (1973)
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## Abstract The undoped Yb~3~Al~5~O~12~ (YbAG) single crystals and doped with 1.5, 10 and 30 at% erbium were grown by the Czochralski method. The YbAG crystals offer efficient emission of laser beam of 2.94 Β΅m and 1.55 Β΅m important for practical applications in communication and medicine. The cryst
## Abstract ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 200 leading journals. To access a ChemInform Abstract of an article which was published elsewhere, please select a βFull Textβ option. The original article is trackable v