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The Influence of Stress on the Fine Structure of Schottky Diode I-U Characteristics in the Breakdown Region

✍ Scribed by Konakova, R. V. ;Tkhorik, Yu. A. ;Zaitsevskii, I. L. ;Kordos, P. ;Morvič, M. ;Cervenak, J.

No coin nor oath required. For personal study only.

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