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Photovoltaic Effect in Schottky Diodes. The Influence of the Depletion Region

✍ Scribed by Toušek, J.


Publisher
John Wiley and Sons
Year
1991
Tongue
English
Weight
343 KB
Volume
128
Category
Article
ISSN
0031-8965

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## Abstract Diffusion length of minority carriers in CdTe wafers was measured by the surface photovoltage (SPV) method. A model including recombination in the space‐charge region (SCR) is presented to explain the SPV spectra. Assuming a thick neutral bulk and an electric field only in the SCR, five