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The influence of porous silica substrate on the properties of alumina films studied by X-ray reflection spectroscopy

✍ Scribed by A. S. Konashuk, A. A. Sokolov, V. E. Drozd, A. A. Romanov, E. O. Filatova

Book ID: 114992974
Publisher: SP MAIK Nauka/Interperiodica
Year: 2012
Tongue: English
Weight: 144 KB
Volume: 38
Category: Article
ISSN: 1063-7850
DOI: 10.1134/s1063785012060235

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