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The influence of Ge grading on the bias and temperature characteristics of SiGe HBTs for precision analog circuits

✍ Scribed by Salmon, S.L.; Cressler, J.D.; Jaeger, R.C.; Harame, D.L.

Book ID: 114538023
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 164 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.822270

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