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The Influence of Defect Surface Layers on the Capacitive Properties of MOS Structures

✍ Scribed by Litovskii, R. N. ;Lysenko, V. S. ;Nazarov, A. N. ;Rudenko, T. E. ;Kaschieva, S. B. ;Nedev, N. R.

Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
519 KB
Volume
77
Category
Article
ISSN
0031-8965

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