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The influence of annealing on the capacitance-voltage characteristics of metal/SIPOS/silicon capacitors

✍ Scribed by Edmund P. Burte

Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
355 KB
Volume
31
Category
Article
ISSN
0038-1101

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πŸ“œ SIMILAR VOLUMES

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Theoretical studies of the capacitance-voltage characteristics of metal-ferroelectric-GaN structures
✍ Jinzhi Ran; Jianhong Yang; Xueyuan Cai πŸ“‚ Article πŸ“… 2011 πŸ› John Wiley and Sons 🌐 English βš– 143 KB

## SUMMARY We have simulated the capacitance versus voltage characteristics (C‐V) of metal‐ferroelectric‐gallium nitride (GaN metal‐ferroelectric‐semiconductor) structures and found useful design rules for improving the devices' performance. The thickness effects of ferroelectric film on the C‐V ar