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The incubation time for hole formation due to electromigration in Al and Al/Cu/Al thin films

✍ Scribed by S. J. Horowitz; I. A. Blech

Book ID: 112817392
Publisher: Springer US
Year: 1975
Tongue: English
Weight: 257 KB
Volume: 4
Category: Article
ISSN: 0361-5235
DOI: 10.1007/bf02660314

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