Microstructural and surface property variations due to the amorphous region formed by thermal annealing in Al-doped ZnO thin films grown on n-Si (1 0 0) substrates

✍ Scribed by J.H. Han; Y.S. No; T.W. Kim; J.Y. Lee; J.Y. Kim; W.K. Choi

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 996 KB
• Volume: 256
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2009.10.038