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The growth of indium on the Si(111) surface studied by X-ray reflectivity and Auger electron spectroscopy

✍ Scribed by M.S. Finney; C. Norris; P.B. Howes; E. Vlieg


Publisher
Elsevier Science
Year
1992
Weight
66 KB
Volume
277
Category
Article
ISSN
0167-2584

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