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The Fourier analysis of the x-ray diffraction profiles obtained from sputtered tantalum films

✍ Scribed by Ryu-Taro Koike; Masahiko Shintani

Book ID: 107862398
Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 326 KB
Volume: 43
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(77)90284-x

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