The evaluation of equipment for a logical circuit
β Scribed by Yu. A. Khetagurov; V. V. Pervov
- Publisher
- Springer US
- Year
- 1969
- Tongue
- English
- Weight
- 456 KB
- Volume
- 2
- Category
- Article
- ISSN
- 1573-8337
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
As integrated circuits scale down into nanometer dimensions, a great reduction on the reliability of combinational blocks is expected. This way, the susceptibility of circuits to intermittent and transient faults is becoming a key parameter in the evaluation of logic circuits, and fast and accurate
Growth of fission yeast at the ends of its cylindrical cells switches from a monopolar to a bipolar mode, before it ceases during mitosis and cell division. Here we assume that these growth modes correspond to three stable states of an underlying regulatory circuit, which is a relatively simple and
An axiomatic semantics is given for restoring logic circuits, both statically and dynamically. As an example the Muller C-element is discussed in detail. It is shown that a consistent circuit reacts in an unambiguous way on new inputs.