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The energy band alignment of Si nanocrystals in SiO2

โœ Scribed by Seguini, G.; Schamm-Chardon, S.; Pellegrino, P.; Perego, M.

Book ID
121513637
Publisher
American Institute of Physics
Year
2011
Tongue
English
Weight
486 KB
Volume
99
Category
Article
ISSN
0003-6951

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## Abstract Energyโ€filtered transmission electron microscopy proves directly that ion irradiation and postโ€irradiation annealing of a Si/SiO~2~ interface results in the formation of a narrow layer of monodisperse Si nanocrystals in the oxide at a tunnel distance from the interface. Position and siz