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The effects of transistor source-to-gate bridging faults in complex CMOS gates

✍ Scribed by Visweswaran, G.S.; Ali, A.-u.-z.M.; Lala, P.K.; Hartmann, C.R.P.

Book ID
119775444
Publisher
IEEE
Year
1991
Tongue
English
Weight
339 KB
Volume
26
Category
Article
ISSN
0018-9200

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