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On the detectability of CMOS floating gate transistor faults

✍ Scribed by Ivanov, A.; Rafiq, S.; Renovell, M.; Azais, F.; Bertrand, Y.

Book ID: 119778732
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 261 KB
Volume: 20
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.905680

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