✦ LIBER ✦
Extending gate-level diagnosis tools to CMOS intra-gate faults
✍ Scribed by Fan, X.; Moore, W.R.; Hora, C.; Gronthoud, G.
- Book ID
- 117810000
- Publisher
- The Institution of Engineering and Technology
- Year
- 2007
- Tongue
- English
- Weight
- 465 KB
- Volume
- 1
- Category
- Article
- ISSN
- 1751-8601
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