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The Effects of Drain-Bias on the Threshold Voltage Instability in Organic TFTs

✍ Scribed by Zan, Hsiao-Wen; Kao, Shin-Chin


Book ID
120934686
Publisher
IEEE
Year
2008
Tongue
English
Weight
107 KB
Volume
29
Category
Article
ISSN
0741-3106

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