✦ LIBER ✦
Effect of channel length on the threshold voltage degradation of hydrogenated amorphous silicon TFTs due to the drain bias stress
✍ Scribed by Kwang-Sub Shin; Jae-Hoon Lee; Sang-Myeon Han; In-Hyuk Song; Min-Koo Han
- Book ID
- 116668939
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 199 KB
- Volume
- 352
- Category
- Article
- ISSN
- 0022-3093
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