Anomalous drain voltage dependence in bias temperature instability measurements on high-κ field effect transistors

✍ Scribed by J.K. Mee; R.A.B. Devine; L. Trombetta; R.J. Kaplar; P. Gouker

• Book ID: 108210930
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 378 KB
• Volume: 51
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2011.02.003