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The effect of SiO2 buffer layer on the electrical and structural properties of Al-doped ZnO films deposited on soda lime glasses

✍ Scribed by K.H. Ri; Y.B. Wang; W.L. Zhou; J.X. Gao; X.J. Wang; J. Yu

Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 514 KB
Volume: 257
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2010.10.099

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